Image Processing of SEM Image Nano Silver Using K-means MATLAB Technique

Elham Jasim Mohammad

Abstract


Nanotechnology is one of the non-exhaustive applications in which image processing is used. For optimal nanoparticle visualization and characterization, the high resolution Scanning Electron Microscope (SEM) and the Atomic Force Microscope (AFM) are used. Image segmentation is one of the critical steps in nanoscale processing. There are also different ways to reach retail, including statistical approximations.In this study; we used the K-means method to determine the optimal threshold using statistical approximation. This technique is thoroughly studied for the SEM nanostructure Silver image. Note that, the image obtained by SEM is good enough to analyze more recently images. The analysis is being used in the field of nanotechnology. The K-means algorithm classifies the data set given to k groups based on certain measurements of certain distances. K-means technology is the most widely used among all clustering algorithms. It is one of the common techniques used in statistical data analysis, image analysis, neural networks, classification analysis and biometric information. K-means is one of the fastest collection algorithms and can be easily used in image segmentation.
The results showed that K-means is highly sensitive to small data sets and performance can degrade at any time. When exposed to a huge data set such as 100.000, the performance increases significantly. The algorithm also works well when the number of clusters is small. This technology has helped to provide a good performance algorithm for the state of the image being tested.

Keywords


K-means, Nano Image, Threshold, Image Processing.

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DOI: http://dx.doi.org/10.23851/mjs.v29i3.635

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